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- ...current became a problem and alternate materials were necessary. These new materials had a lower equivalent oxide thickness so they could retain an appropriate The EOT definition is useful to quickly compare different [[dielectric]] materials to the industry standard silicon oxide dielectric, as: ...2 KB (277 words) - 19:28, 28 February 2021
- ...ctor]] material. It gets its name from the initials of the metal-insulator-semiconductor (MIS) structure. As with the MOS [[field-effect transistor]] structure, for ...organic MOS capacitor based on [[silicon]] and [[silicon dioxide]]. On the semiconductor substrate, a thin layer of oxide (silicon dioxide) is applied (by, for exam ...3 KB (439 words) - 21:30, 11 September 2023
- ...light detector device diagram.png|thumb|A diagram of a MSM light detector semiconductor-based device, image sourced from [[Special:BookSources/9789535117308|ISBN 9 ...put better. They usually follow a [[Metal-semiconductor-metal|MSM]] (Metal Semiconductor Metal) design pattern, usually following a metal "finger" with lines coming ...5 KB (687 words) - 16:51, 24 February 2025
- In [[semiconductors]], the [[band gap]] of a [[semiconductor]] can be of two basic types, a '''direct band gap''' or an '''indirect band ...materials include [[crystalline silicon]] and [[Germanium|Ge]]. Some III–V materials are indirect bandgap as well, for example [[AlSb]]. ...11 KB (1,751 words) - 21:42, 13 January 2025
- ...rom the homogeneous part of the [[semiconductor Bloch equations]] or the [[semiconductor luminescence equations]]. ....</ref><ref name="klingshirn2012semiconductor">Klingshirn, C. F. (2006). ''Semiconductor Optics''. Springer. {{ISBN|978-3540383451}}.</ref> ...10 KB (1,441 words) - 09:03, 11 October 2023
- ...ctric]] dielectric material sandwiched between two electrically conducting materials.<ref name="a">{{cite journal |last1=Garcia |first1=Vincent |last2=Bibes |fi ...ent status and future prospect as a universal memory |journal=Frontiers in Materials |volume=10 |date=2023-09-28 |issn=2296-8016 |doi=10.3389/fmats.2023.1148979 ...9 KB (1,293 words) - 07:42, 1 October 2024
- ...f [[energy]], used to quantify energetic disorder in the band edges of a [[semiconductor]]. It is evaluated by fitting the [[Attenuation coefficient|absorption coef ...increases the further from the band gap. This means the absorbance of the semiconductor will increase with energy.]] ...8 KB (1,130 words) - 09:12, 26 February 2024
- ...100020570|bibcode=1938PCPS...34..568M |s2cid=222602877 }}</ref> The use of semiconductor junctions sparked the [[computer]] revolution in the second half of the 20t ...onductor work function; <math>\chi_s </math>, the electron affinity of the semiconductor.]] ...19 KB (2,914 words) - 22:22, 23 February 2025
- ...1-x)Sb, AlP, AlSb, GaP, GaSb, InP and their compounds (III-V semiconductor materials), along with Silicon Oxide. Applied and/or self-consistent electrostatic an ...substituted by Archimedes, making this one the GNU package for Monte Carlo semiconductor devices simulations.<ref>{{cite mailing list |last=Sellier |first=Jean Mich ...9 KB (1,331 words) - 20:36, 15 September 2024
- {{Short description|How semiconductor lasers work}} ...be solved by development of appropriate theoretical models to describe the semiconductor optical gain and by comparison of the predictions of these models with expe ...15 KB (2,217 words) - 00:47, 1 April 2023
- ...into final products. The use of electroplasticity to improve processing of materials is known as electrically assisted manufacturing. ...fect [[Electron|electrons]] which dictate the [[Chemical bond|bonding]] in materials and therefore all higher level phenomena such as dislocation motion, flow s ...7 KB (977 words) - 21:56, 7 November 2024
- The '''semiconductor [[Felix Bloch|Bloch]] equations'''<ref name="Lindberg88"> Schäfer, W.; Wegener, M. (2002). ''Semiconductor Optics and Transport Phenomena''. Springer. {{ISBN|3540616144}}. ...17 KB (2,352 words) - 21:50, 26 March 2024
- ...isplacement sensors are used in a wide variety of applications including [[semiconductor]] processing, assembly of precision equipment such as [[disk drive]]s, prec ...onductive materials. The other type measures thicknesses of non conductive materials or the level of a fluid. ...12 KB (1,757 words) - 22:47, 4 December 2024
- ...ique used to analyze [[resistivity]] versus depth in [[semiconductor]]s. [[Semiconductor device]]s depend on the distribution of carriers ([[electron]]s or [[electr ...ASTM ATP 960, D. C. Gupta and P. H. Langer, Eds., Am. Soc. for Testing and Materials (1986).</ref> and Casel and Jorke.<ref>A. Casel and H. Jorke, Appl. Phys. L ...8 KB (1,234 words) - 18:11, 18 March 2024
- ...T amplifier is the '''MOSFET amplifier''', which uses [[MOSFET|metal–oxide–semiconductor FETs]] (MOSFETs). The main advantage of a FET used for amplification is tha ...emonstrated |url=https://www.computerhistory.org/siliconengine/metal-oxide-semiconductor-mos-transistor-demonstrated/ |journal=The Silicon Engine: A Timeline of Sem ...8 KB (1,137 words) - 04:09, 29 September 2024
- ...| last2 = Zettler | first2 = J.-T. | title = Real-time analysis of III--V-semiconductor epitaxial growth | journal = Applied Surface Science | volume = 100--101 | [[Category:Materials science]] ...3 KB (338 words) - 08:35, 16 November 2022
- ...687}}</ref> The technique studies the transient [[photoconductivity]] of a semiconductor sample during or after it is illuminated by a light pulse. Electron–hole pa ...4-07 |url=https://onlinelibrary.wiley.com/doi/10.1002/0471749095.ch7 |work=Semiconductor Material and Device Characterization |pages=389–464 |access-date=2023-03-19 ...12 KB (1,621 words) - 02:07, 25 July 2023
- ...G.]]; Gibbs, H. M. (2006). "Semiconductor excitons in new light". ''Nature Materials'' '''5''' (7): 523–531. [[Digital object identifier|doi]]:[https://dx.doi.o ...aspects of laser pulses propagating through matter such as [[atom]]s or [[semiconductor]]s. In quantum-optical spectroscopy, one additionally utilizes the [[Quantu ...17 KB (2,209 words) - 15:41, 26 July 2022
- ...ic deformation. In addition, [[dislocations]] in low stacking-fault energy materials typically dissociate into an ''extended dislocation'', which is a stacking ...ng faults are two dimensional planar defects that can occur in crystalline materials. They can be formed during crystal growth, during plastic deformation as pa ...9 KB (1,397 words) - 21:04, 22 March 2024
- ...orm a [[valence bond]], which locks them in place. However, with [[Doping (semiconductor)|doping]], these electrons can act as mobile [[Cooper pairs]] and are able ...ing that fractional particles can happen in quasi two-dimensional magnetic materials, was found by EPFL scientists<ref>{{Cite journal|title = Fractional excitat ...5 KB (731 words) - 11:23, 14 August 2023