Fluctuation X-ray scattering

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A fluctuation scattering experiment collects a series of X-ray diffraction snapshots of multiple proteins (or other particles) in solution. An ultrabright X-ray laser provides fast snapshots, containing features that are angularly non-isotropic (speckle), ultimately resulting in a detailed understanding of the structure of the sample.

Fluctuation X-ray scattering (FXS)[1][2] is an X-ray scattering technique similar to small-angle X-ray scattering (SAXS), but is performed using X-ray exposures below sample rotational diffusion times. This technique, ideally performed with an ultra-bright X-ray light source, such as a free electron laser, results in data containing significantly more information as compared to traditional scattering methods.[3]

FXS can be used for the determination of (large) macromolecular structures,[4] but has also found applications in the characterization of metallic nanostructures,[5] magnetic domains[6] and colloids.[7]

The most general setup of FXS is a situation in which fast diffraction snapshots of models are taken which over a long time period undergo a full 3D rotation. A particularly interesting subclass of FXS is the 2D case where the sample can be viewed as a 2-dimensional system with particles exhibiting random in-plane rotations. In this case, an analytical solution exists relation the FXS data to the structure.[8] In absence of symmetry constraints, no analytical data-to-structure relation for the 3D case is available, although various iterative procedures have been developed.

Overview

An FXS experiment consists of collecting a large number of X-ray snapshots of samples in a different random configuration. By computing angular intensity correlations for each image and averaging these over all snapshots, the average 2-point correlation function can be subjected to a finite Legendre transform, resulting in a collection of so-called Bl(q,q') curves, where l is the Legendre polynomial order and q / q' the momentum transfer or inverse resolution of the data.

Mathematical background

A visual representation of mathematical relations in Fluctuation X-ray Scattering illustrates the relation between the electron density, scattering amplitude, diffracted intensities and angular correlation data. Image modified from[3]

Given a particle with density distribution ฯ(๐ซ), the associated three-dimensional complex structure factor A(๐ช) is obtained via a Fourier transform

A(๐ช)=โˆซVฯ(๐ซ)exp[i๐ช๐ซ]d๐ซ

The intensity function corresponding to the complex structure factor is equal to

I(๐ช)=A(๐ช)A(๐ช)โˆ—

where โˆ— denotes complex conjugation. Expressing I(๐ช) as a spherical harmonics series, one obtains

I(๐ช)=โˆ‘l=0โˆžโˆ‘m=โˆ’llIlm(q)Ylm(ฮธq,ฯ•q)

The average angular intensity correlation as obtained from many diffraction images Jk(q,ฯ•q) is then

C2(q,q,ฮ”ฯ•q)=12ฯ€Nโˆ‘Nimagesโˆซ02ฯ€Jk(q,ฯ•q)Jk(q,ฯ•q+ฮ”ฯ•q)dฯ•q

It can be shown that

C2(q,q,ฮ”ฯ•q)=โˆ‘lBl(q,q)Pl(cos(ฮธq)cos(ฮธq)+sin(ฮธq)sin(ฮธq)cos[ฮ”ฯ•q])

where

ฮธq=arccos(qฮป4ฯ€)

with ฮป equal to the X-ray wavelength used, and

Bl(q,q)=โˆ‘m=โˆ’llIlm(q)Ilmโˆ—(q)

Pl(โ‹…) is a Legendre Polynome. The set of Bl(q,q) curves can be obtained via a finite Legendre transform from the observed autocorrelation C2(q,q,ฮ”ฯ•q) and are thus directly related to the structure ฯ(๐ซ) via the above expressions.

Additional relations can be obtained by obtaining the real space autocorrelation ฮณ(๐ซ) of the density:

ฮณ(๐ซ)=โˆซVฯ(u)ฯ(๐ซโˆ’๐ฎ)d๐ฎ

A subsequent expansion of ฮณ(๐ซ) in a spherical harmonics series, results in radial expansion coefficients that are related to the intensity function via a Hankel transform

Ilm(q)=โˆซ0โˆžฮณlm(r)jl(qr)r2dr

A concise overview of these relations has been published elsewhere[1][3]

Basic relations

A generalized Guinier law describing the low resolution behavior of the data can be derived from the above expressions:

logBl(q)โˆ’2llogqโ‰ˆlogBlโˆ—โˆ’2q2Rl22l+3

Values of Blโˆ— and Rl can be obtained from a least squares analyses of the low resolution data.[3]

The falloff of the data at higher resolution is governed by Porod laws. It can be shown[3] that the Porod laws derived for SAXS/WAXS data hold here as well, ultimately resulting in:

Bl(q)โˆqโˆ’8

for particles with well-defined interfaces.

Structure determination from FXS data

Currently, there are three routes to determine molecular structure from its corresponding FXS data.

Algebraic phasing

By assuming a specific symmetric configuration of the final model, relations between expansion coefficients describing the scattering pattern of the underlying species can be exploited to determine a diffraction pattern consistent with the measure correlation data. This approach has been shown to be feasible for icosahedral[9] and helical models.[10]

Reverse Monte Carlo

By representing the to-be-determined structure as an assembly of independent scattering voxels, structure determination from FXS data is transformed into a global optimisation problem and can be solved using simulated annealing.[3]

Multi-tiered iterative phasing

The multi-tiered iterative phasing algorithm (M-TIP) overcomes convergence issues associated with the reverse Monte Carlo procedure and eliminates the need to use or derive specific symmetry constraints as needed by the Algebraic method. The M-TIP algorithm utilizes non-trivial projections that modifies a set of trial structure factors A(๐ช) such that corresponding Bl(q,q) match observed values. The real-space image ฯ(๐ซ), as obtained by a Fourier Transform of A(๐ช) is subsequently modified to enforce symmetry, positivity and compactness. The M-TIP procedure can start from a random point and has good convergence properties.[11]

References

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