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In 2006, Farhan Saif used quantum recurrence phenomena of wave packet as a probe to study nano-structures on a surface, naming it '''Recurrence Tracking Mic ...ege Press, 1999).</ref> which is a very high-resolution type of [[scanning probe microscope]] with resolution of fractions of a nanometer. The AFM is one of ...

...he nanoscopic domain. The high sensitivity and selectivity of photothermal microscopy allows even the detection of single molecules by their absorption. Similar In this detection scheme a conventional scanning sample or laser-scanning transmission microscope is employed. Both the heating and the probing laser ...

...croscopy]] (KPFM) and [[Electrostatic force microscope|Electrostatic Force Microscopy]] (EFM). ...e boundary <math>\mathcal{S}</math> is given by the surfaces of sample and probe assumed to be connected at infinity. Then, the potential <math>\Phi_\text{Q ...

...on microscope]]s ("MountainsSEM") and [[Scanning probe microscopy|scanning probe microscopes]] ("MountainsSPIP"). ...nology ''Digital Surf technology on Olympus Microscopes'' in ''Imaging and Microscopy'']</ref><ref>[http://www.engineeringtalk.com/news/diu/diu100.html ''Surface ...

...16|pmc=4586488|title=Full-color structured illumination optical sectioning microscopy|journal=Scientific Reports|volume=5|pages=14513|year=2015|last1=Qian|first1 ...]. Many different techniques for optical sectioning are used and several [[microscopy]] techniques are specifically designed to improve the quality of optical se ...

...scription|Method of microscopy which measures chemical bonding between the probe and surface}} ...Figure 1: Photograph of an AFM system which can be used for chemical force microscopy.]] ...

'''Local oxidation nanolithography''' ('''LON''') is a [[scanning probe lithography|tip-based]] [[nanofabrication]] method. It is based on the spat ...inez, RV |author3=Martinez, J|year=2005 |title=Nano-chemistry and scanning probe nanolithographies |journal=[[Chemical Society Reviews|Chem. Soc. Rev.]] |vo ...

...is a form of [[scanning probe microscopy]] heavily based on [[atomic force microscopy]] (AFM) that maps the [[temperature]] distribution along a surface. Resolut [[File:SJEM schematic.png|thumb|400 px|right|Simplified schematic of scanning joule expansion microscope.]] ...

{{Short description|Microscopy technique for piezoelectric materials}} [[File:Bulk BTO PFM scan.png|thumb|alt=Piezoresponse Force Microscopy image of BaTiO3 domains|PFM of [[barium titanate|BaTiO₃]] single ...

...lative non-degenerate two-photon absorption cross-section for fluorescence microscopy| journal=Optics Express| volume=27|issue=6|pages=8335–8347 |year=2019|last1 ...022|title= Efficient non-degenerate two-photon excitation for fluorescence microscopy| journal=Optics Express| volume=27|issue=20|pages= 28022–28035|year= 2019|l ...

...oscopy]] (STEM), energy filtering devices and so on, made possible smaller probe diameters and larger convergence angles, and all this made CBED more popula ...itle=The determination of foil thickness by scanning transmission electron microscopy |journal=Physica Status Solidi A |date=16 October 1975 |volume=31 |issue=2 ...

...image is then constructed from the force interactions during the scan. The probe is connected to a resonator, usually a silicon [[cantilever]] or a [[Crysta Frequency modulation atomic force microscopy, introduced by Albrecht, Grütter, Horne and Rugar in 1991,<ref name="Albrec ...

{{Short description|Technique of scanning probe microscopy}} ...ak|first3=Juhyoun.|last4=Lev|first4=Ovadia.|title=Scanning electrochemical microscopy. Introduction and principles|journal=Analytical Chemistry|volume=61|issue=2 ...

...a few centimeters. It is often used as an alternative name for [[coherence scanning interferometry]] in the context of areal surface topography instrumentation # [[White light scanner|vertical scanning]] or coherence probe interferometers. ...

<!--[[File:ShEM diagram2.svg|thumb|upright=2.5|Schematic representation of a scanning helium microscope illustrating how images are formed. A helium beam is form [[File:SHeM Schematic.svg|thumb|upright=2.5|A diagram showing how a scanning helium microscope works. A beam is formed by a gas expansion and collimatio ...

...c microscope]] (SAM), scanning laser acoustic microscope (SLAM) and C-mode scanning acoustic microscope (C-SAM). == Infrared (IR) transmission microscopy == ...

{{Short description|Principle and applications of MINFLUX microscopy}} ...itle=Visualizing and discovering cellular structures with super-resolution microscopy |journal=Science |language=en |volume=361 |issue=6405 |pages=880–887 |doi=1 ...

...on microscopy (4D STEM)''' is a subset of [[scanning transmission electron microscopy]] (STEM) which utilizes a pixelated electron detector to capture a [[conver ...electron diffraction (NBED), or pixelated [[Scanning transmission electron microscopy|STEM]].<ref>{{cite web |title=4D STEM {{!}} Gatan, Inc. |url=https://www.ga ...

[[File:Multislice_to_Microscopy.png|thumb|Multislice to Microscopy]] ...ages.<ref name="Kirkland">{{cite book|title=Advanced Computing in Electron Microscopy|author = Dr. Earl J. Kirkland}}</ref> This article describes some relevant ...

...4602221|title=Imaging of current density distributions with a Nb weak-link scanning nano-SQUID microscope|journal=Scientific Reports|volume=5|pages=15097|year= ...lds to be measured with unparalleled resolution and sensitivity. The first scanning SQUID microscope was built in 1992 by Black ''et al.''<ref> ...