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  • ...ual metrology''' refers to methods to predict the properties of a [[Wafer (electronics)|wafer]] based on machine parameters and sensor data in the production equi ...seppe|date=2015-01-01|title=Multi-step virtual metrology for semiconductor manufacturing: A multilevel and regularization methods-based approach|journal=Computers & ...
    3 KB (382 words) - 23:18, 24 November 2023
  • ...nputs are at the same voltage), the output should be zero. However, due to manufacturing process, the differential input transistors of real op-amps may not be exac ...r.com/10.1007/978-3-030-81119-8_32 |work=International Youth Conference on Electronics, Telecommunications and Information Technologies |volume=268 |pages=317–325 ...
    3 KB (508 words) - 04:50, 1 December 2023
  • ...locity, and ''d'' is the laser beam spot diameter.<ref>{{Cite book|title = Manufacturing Processes for Engineering Materials|last = Kalpakjian|publisher = Prentice ...g processes. It is used in the automobile, shipbuilding, aerospace, steel, electronics, and medical industries for precision machining of complex parts. ...
    8 KB (1,275 words) - 23:45, 27 October 2023
  • ...and the physical characteristics of the product and their variation in the manufacturing processes, and the reaction of product elements and materials to loads (str ...ability and the physics of failure program at RADC”, Physics of Failure in Electronics, 1963, pp. 4–10; Spartan.</ref> ...
    15 KB (2,256 words) - 22:21, 30 July 2024
  • ...m was sufficiently bonded to the copper substrate.<ref>{{Cite book|title = Manufacturing Processes for Engineering Materials (5th Ed.)|last = Kalpakjian|first = Ser | title = Manufacturing Processes and Materials (4th illustrated ed.) ...
    13 KB (1,948 words) - 16:21, 27 August 2024
  • ...y [[environmental tests|environmental testing]] for products, particularly electronics, to evaluate resistance to [[corrosion]] due to gases in the atmosphere. Mi ...xed Gas Environments|journal=IEEE Transactions on Components, Hybrids, and Manufacturing Technology|volume=13|issue=1|pages=40–45|doi=10.1109/33.52847}}</ref>  Othe ...
    8 KB (1,114 words) - 02:51, 30 November 2023
  • ...T.; Kim, M.J.; Jung, B.H.; Kook, N.P.; Park, I.Y.; Ahn, J.U.; ''Method for manufacturing high-purity gold with low-purity gold'', K.R. Patent 2,009,031,006, 2009.</ ...
    7 KB (1,107 words) - 07:20, 23 June 2024
  • ...ement and size also by a factor of 10. It achieves these things through a manufacturing process known as [[rapid thermal processing]] (RTP) that uses ultrafine lay | title = WHAT'S NEWS: A review of the latest happenings in electronics ...
    17 KB (2,467 words) - 15:52, 4 January 2025
  • ...urther shrinking the design nodes and topology of semiconductor transistor manufacturing. ...ture capital investment in [[design for manufacturability (IC)|design for manufacturing]] start-up companies.<ref name="DylanMcGrathDFM2005">{{Citation | last = Mc ...
    13 KB (1,784 words) - 14:32, 14 December 2024
  • ...for its low loss characteristic. According to Stephen Lampen of [[Belden (electronics company)|Belden]] Wire & Cable, 75&nbsp;Ω was chosen as the nominal impedan ...icant. The reason for this is that equally spaced errors introduced by the manufacturing process will cancel and be invisible, or at least much reduced, at certain ...
    24 KB (3,556 words) - 17:54, 7 December 2024
  • ...Flex HDI – Via Formation, Structuring, Routing |publisher= LPKF Laser and Electronics |date= 2002 |access-date=20 July 2014}}</ref><ref>{{cite conference | last1 ...rids, and Manufacturing Technology | publisher=Institute of Electrical and Electronics Engineers (IEEE) | volume=13 | issue=4 | year=1990 | issn=0148-6411 | doi=1 ...
    18 KB (2,646 words) - 01:47, 16 May 2024
  • ...arge carrier]]s in a [[semiconductor]], especially in [[silicon]] [[Wafer (electronics)|wafers]].<ref name=":1">{{Cite journal |last1=Bielle-Daspet |first1=D.M. | ...in either quasi-[[Transient response|transient]] or quasi-[[Steady state (electronics)|steady-state]] photoconductance (QSS-PC) measurements. ...
    12 KB (1,621 words) - 02:07, 25 July 2023
  • ...rsolutions.com/hubfs/Resources/services/Temperature-Cycling-and-Fatigue-in-Electronics-White-Paper.pdf</ref> driven due to [[temperature]] cycling.<ref>Wunderle, Historically, tin-lead solders were common alloys used in the [[electronics industry]]. Although they are still used in select industries and applicati ...
    19 KB (2,780 words) - 00:13, 26 December 2024
  • ===Manufacturing=== Sprays are used extensively in manufacturing.<ref>G.G. Nasr, A.J. Yuhl, L. Bendig, Industrial Sprays and Atomization, 20 ...
    26 KB (3,951 words) - 10:23, 19 February 2025
  • ...brid" approach is lower overall system costs, avoiding the distribution of electronics. ...el performance, due to dirt, differential aging or tiny differences during manufacturing, can result in the array as a whole operating away from its best MPPT point ...
    10 KB (1,511 words) - 11:05, 16 January 2024
  • ...s due to the chip's different operational schemes and operation [[Trimmer (electronics)|trimming]] of its analog parts. ...attention to self-heating effects. However, due to technology scaling and manufacturing variations, power dissipation within a single production lot of devices can ...
    20 KB (3,060 words) - 21:45, 22 September 2024
  • ...c random-access memory|static RAM]]) memory cell is a type of [[flip-flop (electronics)|flip-flop]] circuit, typically implemented using MOSFETs. These require ve But memory is a key element of [[Digital electronics|digital systems]]. In computers, it allows to store both programs and data ...
    28 KB (4,011 words) - 04:14, 29 September 2024
  • ...eyrat|first3=F.|last4=Labouré|first4=E.|title=The Current Sensors in Power Electronics, a Review|journal=EPE Journal|date=1 February 2001|volume=11|issue=1|pages= ...last3=Woodward|first3=R. C.|last4=Borle|first4=L. J.|title=2008 IEEE Power Electronics Specialists Conference |chapter=Theoretical and practical analysis of a cur ...
    18 KB (2,662 words) - 06:17, 14 December 2024
  • ...patents. Over time, this group created some of the earliest standards for electronics components. In 1936, the RMA adopted a preferred-number system for the res ...ce for establishing common standards across many industries, especially in electronics, where it was essential to produce large quantities of standardized electro ...
    59 KB (7,075 words) - 05:53, 8 January 2025
  • *[[Printed electronics]] ...usually results from the [[thermal expansion]] (thermal stress) during the manufacturing process. Thermal stress occurs because film depositions are usually made a ...
    12 KB (1,777 words) - 10:47, 22 February 2025
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