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- ...which displays the amount of distortion added to the original signal by an electronic circuit. ...is superimposed on the original signal, and can be detected with suitable equipment. ...2 KB (338 words) - 02:31, 2 September 2024
- ...tgeor/SysE_511/Documents/Test%20and%20Evaluation%20Master%20Plan.pdf|title=Test and Evaluation Master Plan Procedures and Guidelines|publisher=University o ...aluation Master Plan documents the overall structure and objectives of the Test & Evaluation for a program.<ref>{{cite web ...7 KB (1,095 words) - 04:44, 29 March 2024
- [[Category:Electronic test equipment]] ...2 KB (384 words) - 15:45, 6 September 2023
- ...ridge''' or '''TRA bridge''' is a type of [[bridge circuit]] for measuring electronic components, using [[Alternating current|a.c.]] It can be designed to work i ...ly the ratio arm principle was applied more generally, to other classes of electronic components and at frequencies up to [[radio frequency|r.f.]], and with many ...10 KB (1,586 words) - 08:47, 19 May 2024
- ...ive]] test to check the quality of [[concrete]] and natural rocks. In this test, the strength and quality of concrete or rock is assessed by measuring the This test is conducted by passing a pulse of ultrasonic through concrete to be tested ...11 KB (1,548 words) - 04:19, 9 May 2024
- Self-reporting devices include automatic built-in-test (BIT) features that are less intrusive. * Built In Test (BIT) ...18 KB (2,604 words) - 16:57, 29 April 2024
- ...[[electrical noise]] (i.e., a random signal). Noise generators are used to test signals for measuring [[noise figure]], frequency response, and other param ...A source that can be switched on and off ("gated") is beneficial for some test methods. ...8 KB (1,239 words) - 10:15, 25 December 2023
- ...rves as a measure of the accuracy of the impedance match to the item under test. This is especially important for transmitting antennas and their feed lin ...ut [[waveguide]] implementations are also used, with a movable insulated [[Test probe#Near-field probe|probe]] inserted into a longitudinal slot cut into t ...20 KB (3,095 words) - 15:25, 17 March 2023
- ...f terms and concepts related to [[power electronics]] in general and power electronic capacitors in particular. For more definitions in electric engineering, see * Electronic power converters; converters, rectifiers, inverters, filters. ...55 KB (7,970 words) - 22:19, 26 February 2025
- | industry = Security / hotel electronic door locks, in-room safes and energy management systems ...1976, VingCard was acquired in 1994 by [[ASSA ABLOY]], and merged with the electronic safe producer Elsafe<ref name="uksutdents" /> to form VingCard Elsafe in 20 ...16 KB (2,225 words) - 20:43, 22 December 2024
- ...year long deployment at depths of up to 5000 m. Both laboratory and field test results show that the VMCM is capable of making accurate measurements of ho ==Equipment== ...13 KB (2,073 words) - 06:17, 31 July 2024
- {{Short description|Test procedure to determine mechanical properties of a specimen}} ...sion]] until failure. Properties that are directly measured via a tensile test are [[ultimate tensile strength]], [[breaking strength]], maximum [[elongat ...19 KB (2,670 words) - 02:12, 26 January 2025
- ...urge immunity in electrical or electronic equipment. IEC 61000-4-5 defines test set-up, procedures, and classification levels. ...uently used surge waveform. Although this standard is designed for testing equipment as a whole at system level, not for individual protection devices, in pract ...23 KB (3,381 words) - 15:34, 28 June 2024
- ...upply resources, as in portable [[Battery (electricity)|battery]]-operated equipment. ...tree-based state encoding for low power dissipation, Design Automation and Test in Europe (1999) ...5 KB (849 words) - 03:48, 26 December 2024
- ...|date=2018-02-18 |orig-date=2005-10-10 |id=MTN-109 |publisher=Matrix Test Equipment, Inc. |publication-place=Middlesex, New Jersey, USA |url=http://www.matrixt [[Category:Electronic amplifiers]] ...8 KB (1,213 words) - 19:50, 4 September 2023
- ...nd system performance and reduce decision risk during design and after the equipment is fielded. This approach models the root causes of failure such as [[Fatig ...lved from an attempt to better predict the reliability of early generation electronic parts and systems. ...15 KB (2,256 words) - 22:21, 30 July 2024
- {{short description|Temperature range in which the equipment is expected to function reliably}} ...service life are specified in [[MIL-STD-810]], the ''Department of Defense Test Method Standard for Environmental Engineering Considerations and Laboratory ...12 KB (1,780 words) - 00:35, 22 July 2024
- The specimen preparation is sophisticated and the mechanical, electronic properties are important for the bonding technology characterization and co ...the fact that silicon is translucent at wavelength ≥ 1.2 μm. The equipment consists of an infrared lamp as light source and an infrared video system ( ...25 KB (3,565 words) - 21:08, 30 December 2024
- ...al at a given frequency from other signals, in equipment such as [[radar]] equipment, [[microwave relay]] stations, satellite communications, and [[microwave ov ...h the cover removed. The cavity serves as the [[resonant circuit]] of an [[electronic oscillator|oscillator]] using the [[triode]] [[vacuum tube]] inside. Parts ...22 KB (3,346 words) - 14:39, 27 October 2024
- ...solid electrolyte as surface-mountable chip capacitors are mainly used in electronic devices in which little space is available or a low profile is required. Th ...ant parameters for the use of electrolytic capacitors in modern electronic equipment. The lower the ESR the higher the ripple current per volume, thus the bette ...32 KB (4,453 words) - 07:15, 29 September 2024