File:AFMimageRoughGlass20x20.JPG
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AFMimageRoughGlass20x20.JPG (398 × 308 pixels, file size: 41 KB, MIME type: image/jpeg)
| Description | Atomic force microscope topographical scan of a glass surface. The micro and nano-scale features of the glass can be observed, portraying the roughness of the material. The image space is (x,y,z) = (20um x 20um x 420nm). The AFM used was the Veeco di CP-II, scanned in contact mode. Constructed at the Nanorobotics Laboratory at Carnegie Mellon University (http://nanolab.me.cmu.edu). |
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I, the copyright holder of this work, hereby publish it under the following license:
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I, the copyright holder of this work, release this work into the public domain. This applies worldwide. In some countries this may not be legally possible; if so: I grant anyone the right to use this work for any purpose, without any conditions, unless such conditions are required by law. |
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This image is a derivative work of the following images:
- File:AFMimageRoughGlass20x20.png licensed with PD-self
- 2009-02-19T17:43:06Z Linforest 401x326 (191303 Bytes) {{Information |Description=Atomic force microscope topographical scan of a glass surface. The micro and nano-scale features of the glass can be observed, portraying the roughness of the material. The image space is (x,y,z) =
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 00:33, 15 July 2009 | | 398 × 308 (41 KB) | wikimediacommons>Materialscientist | {{Information |Description=Atomic force microscope topographical scan of a glass surface. The micro and nano-scale features of the glass can be observed, portraying the roughness of the material. The image space is (x,y,z) = (20um x 20um x 420nm). The AFM |
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