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- {{About|direct methods in electron diffraction|X-ray diffraction direct methods|Direct methods (crystallograph ...diffraction]], a diffraction pattern is produced by the interaction of the electron beam and the [[crystal]] potential. The [[real coordinate space|real space] ...28 KB (4,200 words) - 00:05, 19 August 2023
- ...hich utilizes a pixelated electron detector to capture a [[convergent beam electron diffraction]] (CBED) pattern at each scan location. This technique captures ...electron diffraction (NBED), or pixelated [[Scanning transmission electron microscopy|STEM]].<ref>{{cite web |title=4D STEM {{!}} Gatan, Inc. |url=https://www.ga ...41 KB (5,769 words) - 23:56, 18 October 2024
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- ...ree-Dimensional Structure from Projections and its Application to Electron Microscopy|year=1970|author1=R. A. Crowther |author2=D. J. DeRosier |author3=A. Klug | ...e=Limits of Three-Dimensional Resolution and Dose for Aberration-Corrected Electron Tomography|year=2021|author1=R. Yalisove |author2=S.H. Sung |author3=P. Erc ...1 KB (173 words) - 02:40, 19 July 2023
- {{See also|Electron optics|Strong focusing}} ...for the focusing or deflection of moving [[charged particles]], such as [[electron]]s or [[ion]]s, by use of the magnetic [[Lorentz force]]. Its strength can ...3 KB (448 words) - 20:59, 23 August 2023
- ...ing transport-of-intensity equation and differential interference contrast microscopy |date=2014|doi=10.1109/ICIP.2014.7025800|pages=3939–3943|isbn=978-1-4799-57 ...e TIE method is also applied for phase retrieval in transmission electron microscopy.<ref>{{Cite journal|last=Belaggia|first=M.|date=2004|title=On the transport ...4 KB (604 words) - 03:44, 26 July 2023
- ...ar method for finding the resolution of a class average in [[cryo-electron microscopy]]. * [[Resolution (electron density)]] ...4 KB (485 words) - 14:36, 6 June 2024
- ...uation]] for the charge density of an atom (including both the nucleus and electron cloud) in the Fourier domain.<ref name=":1" /><ref name=":2" /> Following t ...>f_x(q,Z)</math> is the dimensionless X-ray scattering form factor for the electron density. ...5 KB (749 words) - 11:10, 18 August 2024
- ...>{{cite web |title=Intro to Field Emission |publisher=Field Emission / Ion Microscopy Laboratory, Purdue University, Dept. of Physics |url=http://physics.unipune ...erate magnified real-space images of the surface of a tip apex. Typically, microscopy information pertains to the surface [[crystallography]] (i.e., how the atom ...6 KB (923 words) - 00:18, 13 August 2023
- ...on.<ref>{{Cite web|url=https://www.ebi.ac.uk/pdbe/emdb/|title=The Electron Microscopy Data Bank|website=www.ebi.ac.uk|access-date=2019-01-07}}</ref> * [[Resolution (electron density)]] ...7 KB (868 words) - 18:48, 13 March 2024
- ...a very large [[Ewald's sphere|Ewald sphere]] radius (1/λ), so that electron diffraction generally "lights up" diffraction spots with g-vectors (''hkl'' ...Howie, R. Nicholson, D. W. Pashley and M. J. Whelan (1965/1977) ''Electron microscopy of thin crystals'' (Butterworths/Krieger, London/Malabar FL) {{ISBN|0-88275 ...9 KB (1,337 words) - 21:08, 26 September 2023
- ...16|pmc=4586488|title=Full-color structured illumination optical sectioning microscopy|journal=Scientific Reports|volume=5|pages=14513|year=2015|last1=Qian|first1 ...]. Many different techniques for optical sectioning are used and several [[microscopy]] techniques are specifically designed to improve the quality of optical se ...11 KB (1,499 words) - 07:50, 3 March 2023
- ...ref name=":0">Li, B.; Yan, P. F.; Sui, M. L.; Ma, E. Transmission Electron Microscopy Study of Stacking Faults and Their Interaction with Pyramidal Dislocations == Visualizing stacking faults using electron microscopy == ...9 KB (1,397 words) - 21:04, 22 March 2024
- ...polarisation interferometry]] and [[electron microscope|scanning electron microscopy]] of cross-sections of the sample. Many thickness monitors and controllers ...3 KB (422 words) - 07:02, 3 May 2024
- ...<ref>[http://ssd.phys.strath.ac.uk/techniques/scanning-electron-microscopy/electron-channelling-contrast-imaging-ecci/ SSD group, University of Strathclyde], U ...on of the 'Kikuchi-like reflection patterns' observed by scanning electron microscopy|journal=Philosophical Magazine|series=16|volume=16|issue=144|year=1967|page ...9 KB (1,283 words) - 06:38, 11 December 2023
- ...s. The holographic interference microscopy distinguishes itself from other microscopy methods by using a [[hologram]] and the [[interference (wave propagation)|i ...ethods related to holographic interference microscopy are [[phase contrast microscopy]] and holographic interferometry. ...15 KB (2,192 words) - 09:04, 2 November 2024
- ...energy analyzer working principle.svg|alt=|thumb|upright=1.2|Hemispherical electron energy analyzer.]] ...hemispherical electrostatic energy analyzers for high resolution momentum microscopy|journal=Ultramicroscopy|volume=206|pages=112815|doi=10.1016/j.ultramic.2019 ...10 KB (1,523 words) - 06:50, 13 February 2025
- ..."A denaturation map of the lamda phage DNA molecule determined by electron microscopy". Journal of Molecular Biology 18: pp. 464-476.</ref> Even though modern [[ ...ons of denaturation based on this information. And requirement of electron microscopy made this method more strenuous to perform. ...7 KB (1,017 words) - 01:33, 3 July 2021
- ...8949/9/1/014107|pmid=27877933|pmc=5099802|title=Optics of high-performance electron Microscopes|volume= 9|year= 2008| author= H. H. Rose| issue= 1| journal= Sc [[Category:Electron microscopy]] ...4 KB (530 words) - 11:36, 26 August 2024
- ...013>{{cite journal |author1=L.V. Wang |author2=J. Yao |title=Photoacoustic Microscopy |journal=Laser Photonics Rev.|volume=7|issue=5|page=10|year=2013|doi=10.100 The goal of photoacoustic microscopy is to find the local pressure rise <math>p_0</math>, which can be used to c ...16 KB (2,229 words) - 08:59, 6 May 2024
- {{Short description|Electron diffraction using very short pulses}} ...oduce a motion picture of the changes that occurred in the data. Ultrafast electron diffraction can provide a wealth of dynamics on charge carriers, atoms, and ...11 KB (1,405 words) - 21:28, 24 August 2024
- ...), [[scanning electron microscope]]s ("MountainsSEM") and [[Scanning probe microscopy|scanning probe microscopes]] ("MountainsSPIP"). ...nology ''Digital Surf technology on Olympus Microscopes'' in ''Imaging and Microscopy'']</ref><ref>[http://www.engineeringtalk.com/news/diu/diu100.html ''Surface ...19 KB (2,547 words) - 05:00, 6 February 2025
- ...ransfer function.jpg|thumb|Power spectrum (Fourier transform) of a typical electron micrograph. The effect of the contrast transfer function can be seen in th ...ction (CTF) sets the resolution of [[high-resolution transmission electron microscopy]] (HRTEM), also known as phase contrast TEM. ...19 KB (2,980 words) - 14:43, 29 October 2024